APA aipamena

Abran, A. (2010). Software metrics and software metrology. John Wiley & Sons.

Chicago Style aipamena

Abran, Alain. Software Metrics and Software Metrology. New Jersey: John Wiley & Sons, 2010.

MLA aipamena

Abran, Alain. Software Metrics and Software Metrology. John Wiley & Sons, 2010.

Kontuz: berrikusi erreferentzia hauek erabili aurretik.