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Photothermal beam deflection for non-destructive evaluation of semiconductor thin films (Thesis)
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| Outros autores: | |
| Formato: | Ph.D Thesis |
| Idioma: | English |
| Publicado: |
Kochi
Department of Physics, CUSAT
2010
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| Subjects: |
UL
| Número de Clasificación: |
535.211:539.216 ANI T |
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| Copia | Live Status Unavailable |