Photothermal beam deflection for non-destructive evaluation of semiconductor thin films (Thesis)

Opis bibliograficzny
1. autor: Anitha R Warrier
Kolejni autorzy: Vijaya Kumar, K.P; guided by
Format: Ph.D Thesis
Język:English
Wydane: Kochi Department of Physics, CUSAT 2010
Hasła przedmiotowe:
Non-destructive testing-semiconductor thin films
Photothermal beam deflection
Photothermal techniques-solar cells
Opis
Opis fizyczny:104p.

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