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Emerging nanotechnologies: test, defect tolerance and reliability
| Autor Principal: | |
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| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
New York
Springer
2008
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| Subjects: |
UL
| Número de Clasificación: |
620.3 TEH |
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| Copia | Live Status Unavailable |