Á lódáil...
Emerging nanotechnologies: test, defect tolerance and reliability
Príomhúdar: | |
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Formáid: | Printed Book |
Teanga: | English |
Foilsithe: |
New York
Springer
2008
|
Ábhair: |
UL
Gairmuimhir: |
620.3 TEH |
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Cóip | Live Status Unavailable |