Emerging nanotechnologies: test, defect tolerance and reliability

Bibliographic Details
Main Author: Tehranipoor, Mohammad (ed. by)
Format: Printed Book
Language:English
Published: New York Springer 2008
Subjects:
Nanotechnology > Quantum- dot cellular Automata

UL

Holdings details from UL
Call Number: 620.3 TEH
Copy Live Status Unavailable

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