Chargement en cours...
Emerging nanotechnologies: test, defect tolerance and reliability
| Auteur principal: | |
|---|---|
| Format: | Printed Book |
| Langue: | English |
| Publié: |
New York
Springer
2008
|
| Sujets: |
| Description: | |
|---|---|
| Description matérielle: | xii, 405p. |
| ISBN: | 9780387747460 |