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Emerging nanotechnologies: test, defect tolerance and reliability
| Hovedforfatter: | |
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| Format: | Printed Book |
| Sprog: | English |
| Udgivet: |
New York
Springer
2008
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| Fag: |
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| Fysisk beskrivelse: | xii, 405p. |
| ISBN: | 9780387747460 |