Llwytho...
Emerging nanotechnologies: test, defect tolerance and reliability
Prif Awdur: | |
---|---|
Fformat: | Printed Book |
Iaith: | English |
Cyhoeddwyd: |
New York
Springer
2008
|
Pynciau: |
Disgrifiad o'r Eitem: | |
---|---|
Disgrifiad Corfforoll: | xii, 405p. |
ISBN: | 9780387747460 |