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| LEADER |
00704nam a2200253 a 4500 |
| 001 |
adlib96000001 |
| 003 |
ViArRB |
| 005 |
20151026132400.0 |
| 008 |
960221s1955 dcuabcdjdbkoqu001 0deng d |
| 020 |
|
|
|a 9780387764863
|
| 022 |
|
|
|
| 040 |
|
|
|a Adlib
|
| 082 |
|
|
|a 620.3
|
| 245 |
|
|
|a Nanometer technology designs:high quality delay tests
|
| 250 |
|
|
|
| 260 |
|
|
|a New York
|b Springer
|c 2008
|
| 300 |
|
|
|a xvii,281p.
|
| 500 |
|
|
|a
|
| 100 |
|
|
|a Tehranipoor, Mohammad
|
| 700 |
|
|
|a Ahmed,Nisar
|
| 942 |
|
|
|c BK
|6 _
|
| 653 |
|
|
|a Nanotechnology design
|a Nanometer technology
|
| 999 |
|
|
|c 47533
|d 47533
|
| 952 |
|
|
|0 0
|1 0
|4 0
|6 6203_TEH
|7 0
|9 60116
|a UL
|b UL
|d 2010-06-16
|o 620.3 TEH
|p 00060997
|r 2010-06-16
|w 2010-06-16
|y BK
|