APA引文

Tehranipoor, M., & Ahmed,Nisar. (2008). Nanometer technology designs: High quality delay tests. Springer.

Chicago Edition Citation

Tehranipoor, Mohammad, and Ahmed,Nisar. Nanometer Technology Designs: High Quality Delay Tests. New York: Springer, 2008.

MLA引文

Tehranipoor, Mohammad, and Ahmed,Nisar. Nanometer Technology Designs: High Quality Delay Tests. Springer, 2008.

警告：這些引文格式不一定是100％准確.