Tehranipoor, M., & Ahmed,Nisar. (2008). Nanometer technology designs: High quality delay tests. Springer.
Citación estilo ChicagoTehranipoor, Mohammad, and Ahmed,Nisar. Nanometer Technology Designs: High Quality Delay Tests. New York: Springer, 2008.
Cita MLATehranipoor, Mohammad, and Ahmed,Nisar. Nanometer Technology Designs: High Quality Delay Tests. Springer, 2008.
Warning: These citations may not always be 100% accurate.