Tehranipoor, M., & Ahmed,Nisar. (2008). Nanometer technology designs: High quality delay tests. Springer.
Chicago Edition CitationTehranipoor, Mohammad, i Ahmed,Nisar. Nanometer Technology Designs: High Quality Delay Tests. New York: Springer, 2008.
Cita MLATehranipoor, Mohammad, i Ahmed,Nisar. Nanometer Technology Designs: High Quality Delay Tests. Springer, 2008.
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