Cita APA

Tehranipoor, M., & Ahmed,Nisar. (2008). Nanometer technology designs: High quality delay tests. Springer.

Chicago Edition Citation

Tehranipoor, Mohammad, i Ahmed,Nisar. Nanometer Technology Designs: High Quality Delay Tests. New York: Springer, 2008.

Cita MLA

Tehranipoor, Mohammad, i Ahmed,Nisar. Nanometer Technology Designs: High Quality Delay Tests. Springer, 2008.

Atenció: Aquestes cites poden no estar 100% correctes.