APA-viite

Wang, L., & Stround, C. E. T. (2008). System-on-chip test architectures: Nanometer design for testability. Morgan Kaufmann.

Chicago-tyylinen lähdeviittaus

Wang, Laung-Terng, ja Charles E. Touba Stround. System-on-chip Test Architectures: Nanometer Design for Testability. Boston: Morgan Kaufmann, 2008.

MLA-viite

Wang, Laung-Terng, ja Charles E. Touba Stround. System-on-chip Test Architectures: Nanometer Design for Testability. Morgan Kaufmann, 2008.