Nalaganje...
Scanning probe microscopy: atomic scale engineering by forces and currents
| Glavni avtor: | |
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| Drugi avtorji: | |
| Format: | Printed Book |
| Jezik: | English |
| Izdano: |
New York
Springer
2006
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| Teme: |
UL
| Signatura: |
620.186 FOS |
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| Kopija | Zaloga ni dosegljiva |