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Scanning probe microscopy: atomic scale engineering by forces and currents
Hovedforfatter: | |
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Andre forfattere: | |
Format: | Printed Book |
Sprog: | English |
Udgivet: |
New York
Springer
2006
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Fag: |
UL
Klassifikationsnummer: |
620.186 FOS |
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Kopi | Live Status Unavailable |