Nalaganje...
Scanning probe microscopy: atomic scale engineering by forces and currents
| Glavni avtor: | Foster, A. |
|---|---|
| Drugi avtorji: | Hofer, W. |
| Format: | Printed Book |
| Jezik: | English |
| Izdano: |
New York
Springer
2006
|
| Teme: |
Podobne knjige/članki
-
Scanning probe microscopy: analytical methods
od: Wiesendanger, Roland; Editor
Izdano: (1998) -
Scanning probe microscopy of soft matter Fundamentals and practices
od: Tsukruk,Vladimir V
Izdano: (2012) -
Scanning probe microscopies beyond imaging: manipulation of molecules and nanostructures
od: Samori, Paolo; Editor
Izdano: (2006) -
Scanning probe microscopy of functional materials : nanoscale imaging and spectroscopy /
Izdano: (2010) -
Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale
od: Kalinin, Sergei
Izdano: (2007)