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Scanning probe microscopy: atomic scale engineering by forces and currents
| 第一著者: | Foster, A. |
|---|---|
| その他の著者: | Hofer, W. |
| フォーマット: | Printed Book |
| 言語: | English |
| 出版事項: |
New York
Springer
2006
|
| 主題: |
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