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Scanning probe microscopy: atomic scale engineering by forces and currents
| मुख्य लेखक: | Foster, A. |
|---|---|
| अन्य लेखक: | Hofer, W. |
| स्वरूप: | Printed Book |
| भाषा: | English |
| प्रकाशित: |
New York
Springer
2006
|
| विषय: |
समान संसाधन
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