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Scanning probe microscopy: atomic scale engineering by forces and currents

Sonraí Bibleagrafaíochta
Príomhúdar:	Foster, A.
Údair Eile:	Hofer, W.
Formáid:	Printed Book
Teanga:	English
Foilsithe:	New York Springer 2006
Ábhair:	Scanning probe microscopy

Míreanna Comhchosúla

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