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Scanning probe microscopy: atomic scale engineering by forces and currents
| Egile nagusia: | Foster, A. |
|---|---|
| Beste egile batzuk: | Hofer, W. |
| Formatua: | Printed Book |
| Hizkuntza: | English |
| Argitaratua: |
New York
Springer
2006
|
| Gaiak: |
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