Á lódáil...
Scanning probe microscopy: atomic scale engineering by forces and currents
| Príomhúdar: | |
|---|---|
| Údair Eile: | |
| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
New York
Springer
2006
|
| Ábhair: |
UL
| Gairmuimhir: |
620.186 FOS |
|---|---|
| Cóip | Live Status Unavailable |