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|a Adlib
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|a 620.186
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|a Scanning probe microscopy: atomic scale engineering by forces and currents
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260 |
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|a New York
|b Springer
|c 2006
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300 |
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|a xiv, 281p
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|a
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|a Foster, A.
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|a Hofer, W.
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|a Scanning probe microscopy
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