Á lódáil...
Scanning probe microscopy: atomic scale engineering by forces and currents
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| Údair Eile: | |
| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
New York
Springer
2006
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| Cur Síos Fisiciúil: | xiv, 281p |
| ISBN: | 9780387400907 |