APA引用形式

Foster, A., & Hofer, W. (2006). Scanning probe microscopy: Atomic scale engineering by forces and currents. Springer.

シカゴスタイル引用形

Foster, A., , W. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. New York: Springer, 2006.

MLA引用形式

Foster, A., , W. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Springer, 2006.