Foster, A., & Hofer, W. (2006). Scanning probe microscopy: Atomic scale engineering by forces and currents. Springer.
Stile di citazione ChicagoFoster, A., e W. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. New York: Springer, 2006.
Citazione MLAFoster, A., e W. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Springer, 2006.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.