Foster, A., & Hofer, W. (2006). Scanning probe microscopy: Atomic scale engineering by forces and currents. Springer.
Čikaški stil citiranjaFoster, A., i W. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. New York: Springer, 2006.
MLA način citiranjaFoster, A., i W. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Springer, 2006.
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