Foster, A., & Hofer, W. (2006). Scanning probe microscopy: Atomic scale engineering by forces and currents. Springer.
Παραπομπή Chicago StyleFoster, A., και W. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. New York: Springer, 2006.
Παραπομπή MLAFoster, A., και W. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Springer, 2006.
Πρόσοχή: Οι παραπομπές μπορεί να μην είναι 100% ακριβείς.