Foster, A., & Hofer, W. (2006). Scanning probe microscopy: Atomic scale engineering by forces and currents. Springer.
Chicago Edition CitationFoster, A., and W. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. New York: Springer, 2006.
MLA Edition CitationFoster, A., and W. Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Springer, 2006.
Warning: These citations may not always be 100% accurate.