Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale

other_versions_link
Bibliographic Details
Main Author: Kalinin, Sergei
Format: Printed Book
Language:English
Published: New York Springer 2007
Subjects:
Scanning probe microscopy > Nanoelectronics
LEADER 00863nam a2200265 a 4500
001 adlib96000001
003 ViArRB
005 20151026132233.0
008 960221s1955 dcuabcdjdbkoqu001 0deng d
020 |a 9780387286679 
022
040 |a Adlib 
082 |a 621.385.833 
245 |a Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale 
250
260 |a New York  |b Springer  |c 2007 
300 |a xx, 980p. 
500 |a   
100 |a Kalinin, Sergei 
700
942 |c BK  |6 _ 
653 |a Scanning probe microscopy  |a Nanoelectronics 
999 |c 44416  |d 44416 
952 |0 0  |1 0  |4 0  |6 621385833_KAL1  |7 0  |9 56661  |a UL  |b UL  |d 2010-06-16  |o 621.385.833 KAL.1  |p 00057588  |r 2010-06-16  |w 2010-06-16  |y BK 
952 |0 0  |1 0  |4 0  |6 621385833_KAL2  |7 0  |9 56662  |a UL  |b UL  |d 2010-06-16  |o 621.385.833 KAL.2  |p 00057589  |r 2010-06-16  |w 2010-06-16  |y BK 

Similar Items