Chargement en cours...
Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale
| Auteur principal: | |
|---|---|
| Format: | Printed Book |
| Langue: | English |
| Publié: |
New York
Springer
2007
|
| Sujets: |
| Description: | |
|---|---|
| Description matérielle: | xx, 980p. |
| ISBN: | 9780387286679 |