CMOS electronics: How it works, how it fails

Bibliographic Details
Main Author: Segura, Jaume
Other Authors: Hawkins, Charles F.
Format: Printed Book
Language:English
Published: USA Wiley-Interscience 2004
Subjects:
Electronic failure analysis > Integrated circuits- failure analysis > Complementary metal oxide semiconductor (CMOS) > CMOS

UL

Holdings details from UL
Call Number: 621.38.004.65 SEG
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