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Physics of thin films: advances in research and development

Bibliographic Details
Other Authors: Francombe, Maurice H. (Editor), Vossen, John L.
Format: Printed Book
Language:English
Published: New York Academic Press 1993
Subjects:
Description
Item Description: V.17: Mechanic and dielectric properties
Physical Description:xiii, 397p.
ISBN:0-12-533017-0