Lanean...
Design and analysis of accelerated tests for mission critical reliability
| Formatua: | Printed Book |
|---|---|
| Hizkuntza: | English |
| Argitaratua: |
USA
CRC press
2004
|
| Gaiak: |
| Deskribapen fisikoa: | 236p. |
|---|---|
| ISBN: | 1-58488-471-1 |