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VLSI test principles and architectures: design for testability
Hovedforfatter: | |
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Andre forfattere: | , |
Format: | Printed Book |
Sprog: | English |
Udgivet: |
Amsterdam
Elsevier
2006
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Serier: | (Morgan Kaufmann series in systems on silicon)
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Fag: |
UL
Klassifikationsnummer: |
621.3.049.77 WAN |
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Kopi | Live Status Unavailable |