VLSI test principles and architectures: design for testability

Detalhes bibliográficos
Autor principal: Wang, laung-Terng [ed.] (ed. by)
Outros Autores: Cheng-Wu [ed.], Xiaoqing Wen [ed.]
Formato: Printed Book
Idioma:English
Publicado em: Amsterdam Elsevier 2006
Colecção:(Morgan Kaufmann series in systems on silicon)
Assuntos:
Integrated circuits-very large scale integration-testing > Integrated circuits-very large scale integration-design

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