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VLSI test principles and architectures: design for testability

Manylion Llyfryddiaeth
Prif Awdur:	Wang, laung-Terng [ed.] (ed. by)
Awduron Eraill:	Cheng-Wu [ed.], Xiaoqing Wen [ed.]
Fformat:	Printed Book
Iaith:	English
Cyhoeddwyd:	Amsterdam Elsevier 2006
Cyfres:	(Morgan Kaufmann series in systems on silicon)
Pynciau:	Integrated circuits-very large scale integration-testing > Integrated circuits-very large scale integration-design

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