VLSI test principles and architectures: design for testability

Bibliographic Details
Main Author: Wang, laung-Terng [ed.] (ed. by)
Other Authors: Cheng-Wu [ed.], Xiaoqing Wen [ed.]
Format: Printed Book
Language:English
Published: Amsterdam Elsevier 2006
Series:(Morgan Kaufmann series in systems on silicon)
Subjects:
Integrated circuits-very large scale integration-testing > Integrated circuits-very large scale integration-design

UL

Holdings details from UL
Call Number: 621.3.049.77 WAN
Copy Live Status Unavailable

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