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VLSI test principles and architectures: design for testability
| Hovedforfatter: | |
|---|---|
| Andre forfattere: | , |
| Format: | Printed Book |
| Sprog: | English |
| Udgivet: |
Amsterdam
Elsevier
2006
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| Serier: | (Morgan Kaufmann series in systems on silicon)
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| Fag: |
UL
| Klassifikationsnummer: |
621.3.049.77 WAN |
|---|---|
| Kopi | Live Status Unavailable |