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091021t xxu||||| |||| 00| 0 eng d |
| 080 |
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|a 621.3.049.77
|b WAN
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| 100 |
|
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|a Wang, laung-Terng [ed.]
|e ed. by
|9 7817
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| 245 |
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|a VLSI test principles and architectures:
|b design for testability
|
| 300 |
|
|
|a xxx, 777p.
|
| 490 |
|
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|a (Morgan Kaufmann series in systems on silicon)
|
| 653 |
|
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|a Integrated circuits-very large scale integration-testing
|a Integrated circuits-very large scale integration-design
|
| 700 |
|
|
|a Cheng-Wu [ed.]
|9 7818
|
| 700 |
|
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|a Xiaoqing Wen [ed.]
|9 7819
|
| 942 |
|
|
|c BK
|6 _
|
| 260 |
|
|
|a Amsterdam
|b Elsevier
|c 2006
|9 6900
|
| 020 |
|
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|a 0-12-370597-5
|
| 999 |
|
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|c 3451
|d 3451
|
| 952 |
|
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|0 0
|1 0
|2 udc
|4 0
|6 621304977_WAN
|7 0
|9 14048
|a UL
|b UL
|d 2009-10-21
|l 1
|o 621.3.049.77 WAN
|p 00056985
|r 2011-06-17
|s 2011-06-03
|w 2009-10-21
|y BK
|