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VLSI test principles and architectures: design for testability
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| 其他作者: | , |
| 格式: | Printed Book |
| 语言: | English |
| 出版: |
Amsterdam
Elsevier
2006
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| 丛编: | (Morgan Kaufmann series in systems on silicon)
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| 实物描述: | xxx, 777p. |
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| ISBN: | 0-12-370597-5 |