VLSI test principles and architectures: design for testability

ग्रंथसूची विवरण
मुख्य लेखक: Wang, laung-Terng [ed.] (ed. by)
अन्य लेखक: Cheng-Wu [ed.], Xiaoqing Wen [ed.]
स्वरूप: Printed Book
भाषा:English
प्रकाशित: Amsterdam Elsevier 2006
श्रृंखला:(Morgan Kaufmann series in systems on silicon)
विषय:
Integrated circuits-very large scale integration-testing > Integrated circuits-very large scale integration-design
विवरण
भौतिक वर्णन:xxx, 777p.
आईएसबीएन:0-12-370597-5

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