VLSI test principles and architectures: design for testability

Sonraí Bibleagrafaíochta
Príomhúdar: Wang, laung-Terng [ed.] (ed. by)
Údair Eile: Cheng-Wu [ed.], Xiaoqing Wen [ed.]
Formáid: Printed Book
Teanga:English
Foilsithe: Amsterdam Elsevier 2006
Sraith:(Morgan Kaufmann series in systems on silicon)
Ábhair:
Integrated circuits-very large scale integration-testing > Integrated circuits-very large scale integration-design
Cur Síos
Cur Síos Fisiciúil:xxx, 777p.
ISBN:0-12-370597-5

Míreanna Comhchosúla