VLSI test principles and architectures: design for testability

Détails bibliographiques
Auteur principal: Wang, laung-Terng [ed.] (ed. by)
Autres auteurs: Cheng-Wu [ed.], Xiaoqing Wen [ed.]
Format: Printed Book
Langue:English
Publié: Amsterdam Elsevier 2006
Collection:(Morgan Kaufmann series in systems on silicon)
Sujets:
Integrated circuits-very large scale integration-testing > Integrated circuits-very large scale integration-design
Description
Description matérielle:xxx, 777p.
ISBN:0-12-370597-5

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