Llwytho...
VLSI test principles and architectures: design for testability
| Prif Awdur: | |
|---|---|
| Awduron Eraill: | , |
| Fformat: | Printed Book |
| Iaith: | English |
| Cyhoeddwyd: |
Amsterdam
Elsevier
2006
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| Cyfres: | (Morgan Kaufmann series in systems on silicon)
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| Pynciau: |
| Disgrifiad Corfforoll: | xxx, 777p. |
|---|---|
| ISBN: | 0-12-370597-5 |