एपीए उद्धरण

Wang, l. [., Cheng-Wu [ed.], & Xiaoqing Wen [ed.]. (2006). VLSI test principles and architectures: Design for testability. Elsevier.

शिकागो स्टाइल उद्धरण

Wang, laung-Terng [ed.], Cheng-Wu [ed.], और Xiaoqing Wen [ed.]. VLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier, 2006.

एमएलए उद्धरण

Wang, laung-Terng [ed.], et al. VLSI Test Principles and Architectures: Design for Testability. Elsevier, 2006.