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Stochastic reliability modeling, optimization and applications /

Bibliographic Details
Main Author: Nakamura, Syouji. ed
Other Authors: Nakamura, Syouji, Nakagawa, Toshio
Format: Printed Book
Language:English
Published: Singapore ; Hackensack, NJ : World Scientific, c2010.
Subjects:
Description
Physical Description:xvi, 300 p. : ill. ;
ISBN:9789814277433
9814277436