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Applied cryptanalysis : breaking ciphers in the real world /

Bibliographic Details
Main Author: Stamp, Mark
Other Authors: Low, Richard M.
Format: Printed Book
Language:English
Published: Hoboken, N.J. : John Wiley and sons, c2007.
Subjects:
Description
Item Description:"A John Wiley & Sons, Inc., publication."
Physical Description:xix, 401 p. : ill. ;