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Fundamental principles of engineering nanometrology
| Autor Principal: | |
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| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
Amsterdam,
Elsevier
2014.
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| Edición: | 2nd ed. |
| Subjects: |
PHY
| Número de Clasificación: |
620.50287 LEA |
|---|---|
| Copia | Live Status Unavailable |