APA-referens

Leach, R. (2014). Fundamental principles of engineering nanometrology (2nd ed.). Elsevier.

Chicago-stil citat

Leach, Richard. Fundamental Principles of Engineering Nanometrology. 2nd ed. Amsterdam: Elsevier, 2014.

MLA-referens

Leach, Richard. Fundamental Principles of Engineering Nanometrology. 2nd ed. Elsevier, 2014.

Varning: dessa hänvisningar är inte alltid fullständigt riktiga.